Presented By O'Reilly and Cloudera
Make Data Work
5–7 May, 2015 • London, UK
Mike Haley

Mike Haley
Senior Director of Machine Intelligence, Autodesk, Inc.


Mike leads the Emerging Products & Technology team at Autodesk where they identify, evaluate, and develop disruptive technologies that improve the practice of imagining, designing, and creating a better world. His team combines research, development, and user experience in coupled iterative cycles to develop new products and foundational technology. For the last several years Mike’s team has been focused on bringing geometric shape analysis and large scale machine learning techniques to 3D design information with the intent to make software a true partner in the design process.

Formerly, Mike led the move of Autodesk products from the desktop to the cloud by driving the adoption of scalable distributed compute and data technology. Prior to joining Autodesk, Mike performed research and product development in the fields of volumetric graphics, distributed multimedia, computer vision, and embedded systems. He is drawn to areas where he can combine his 25 years of experience in computer graphics, distributed systems, and mathematical analysis. Mike holds an MS in computer science from the University of Cape Town, South Africa.


9:25–9:35 Thursday, 7/05/2015
Location: King's Suite
Mike Haley (Autodesk, Inc.)
Average rating: ***..
(3.84, 19 ratings)
Jet engines, lifelike movie monsters, cancer-fighting nanorobots, and bespoke products. We live in a world where everything around us is designed by someone. The pace of innovation is escalating and with new methods of manufacturing, such as 3D printing, the demands placed on designers and design technology are increasing. Read more.
10:55–11:35 Thursday, 7/05/2015
Office Hour
Location: Table B
Mike Haley (Autodesk, Inc.)
Talk to Mike about how engineering and design processes are changing. You’ll learn about geometric data processing and shape analysis, and how Autodesk has made use of Apache Spark and graph databases. Read more.