Mar 15–18, 2020
Jeffrey Vah

Jeffrey Vah
Senior Principal Test Engineer, Dell Technologies


Jeffrey Vah is a senior principal test engineer at Dell Technologies. He has 26+ years of experience in test engineering and 7 years in engineering management, test design, tools, and automation. He’s the coauthor of the article, “The Intersection of Predictive Analytics, Predictive Repair, and Reverse Supply Chain.” He’s a co-inventor of five pending patents for innovative use of machine learning models at Dell Technologies, and a co-inventor of a patent for innovative hardware design at Microsoft.


9:05am9:30am Monday, March 16, 2020
Location: LL20A
Secondary topics:  Data Quality
Jeffrey Vah (Dell Technologies), Gayathri Rau (Dell Technologies)
To deliver best-in-class data science products, solutions must evolve through partnerships between data scientists and domain experts. Jeffrey Vah and Gayathri Rau detail the product lifecycle journey while integrating business expertise with data scientists and technologists. You'll discover best practices and pitfalls when digitally transforming your business through AI and machine learning. Read more.

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