Presented By
O’Reilly + Intel AI
Put AI to Work
April 15-18, 2019
New York, NY

Seeing is Deceiving: The rise of fake media & how we can fight back with technologies

Siwei Lyu (University of Albany)
11:05am11:45am Wednesday, April 17, 2019
Models and Methods
Location: Regent Parlor
Secondary topics:  Computer Vision, Ethics, Privacy, and Security, Models and Methods

The past few years have seen a startling and troubling rise in fake online media that are challenging visual imagery as a definite record of reality. In particular, recent and rapid advances in machine learning are making it easier than ever to create sophisticated and compelling fake images and videos, escalating the scale and danger of the fake-news phenomena. In this talk, I will first briefly review the evolution of techniques behind the generation of fake media, and then introduce several projects I was involved in digital media forensics for detection of fake media, with a special focus on some of our recent works on detecting AI-generated fake videos (DeepFakes).

Photo of Siwei Lyu

Siwei Lyu

University of Albany

Siwei Lyu is a tenured Associate Professor at the Department of Computer Science, the College of Engineering and Applied Sciences, the University at Albany, State University of New York. He is the Director of Computer Vision and Machine Learning Lab (CVML) at University at Albany, State University of New York. Dr. Lyu received his Ph.D. degree in Computer Science from Dartmouth College in 2005. His research interests include digital image forensics, computer vision, computational neuroscience and machine learning. Dr. Lyu has published over 110 refereed journal and conference papers. He is the recipient of the IEEE Signal Processing Society Best Paper Award in 2011, the National Science Foundation CAREER Award in 2010, SUNY Albany’s Presidential Award for Excellence in Research and Creative Activities (2017), and SUNY Chancellor’s Award for Excellence in Research and Creative Activities (2018). He is a senior member of International Society of Electric and Electronic Engineers (IEEE), and a member of Omicron Delta Kappa (OΔΚ).

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